Analysis of Material Properties

Advanced analysis of crystalline, electrical, optical and topological material properties:

  • high resolution X-ray diffraction (HRXRD)
  • photoluminescence (PL)
  • Fourier transform infrared spectroscopy (FTIR)
  • electroluminescence (EL)
  • scanning electron microscopy (SEM)
Figure 1: High-resolution picture of semiconductor structure
High-resolution picture of semiconductor structure

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